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Ultramicroscopy
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January 14, 2003
A novel STM-assisted microwave microscope with capacitance and loss imaging capability
Atif Imtiaz, Steven M Anlage
Nanotechnology
|
September 27, 2014
GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy
Joel C Weber, Paul T Blanchard, Aric W Sanders, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Ultramicroscopy
|
January 14, 2003
A novel STM-assisted microwave microscope with capacitance and loss imaging capability
Atif Imtiaz, Steven M Anlage
Nanotechnology
|
September 27, 2014
GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy
Joel C Weber, Paul T Blanchard, Aric W Sanders, et al.
Page
of 1