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Avishkar Lamsal

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Sensors (Basel, Switzerland)|November 13, 2025
Advanced Signal Analysis Model for Internal Defect Mapping in Bridge Decks Using Impact-Echo Field TestingAvishkar Lamsal, Biggyan Lamsal, Bum-Jun Kim, et al.
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Showing results (1-10 of 1) with videos related to

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Pageof 1
Sensors (Basel, Switzerland)|November 13, 2025
Advanced Signal Analysis Model for Internal Defect Mapping in Bridge Decks Using Impact-Echo Field TestingAvishkar Lamsal, Biggyan Lamsal, Bum-Jun Kim, et al.
Pageof 1