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Ayumu Oyaizu

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Microscopy (Oxford, England)|July 2, 2026
Vogel spiral-based tilt-scan averaging approach for robust and efficient diffraction contrast suppression in DPC STEMAyumu Oyaizu, Satoko Toyama, Takehito Seki, et al.
Microscopy (Oxford, England)|May 21, 2026
In-situ biasing DPC STEM observation of GaAs p-n junctionSatoko Toyama, Yoshifumi Kojima, Ayumu Oyaizu, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Microscopy (Oxford, England)|July 2, 2026
Vogel spiral-based tilt-scan averaging approach for robust and efficient diffraction contrast suppression in DPC STEMAyumu Oyaizu, Satoko Toyama, Takehito Seki, et al.
Microscopy (Oxford, England)|May 21, 2026
In-situ biasing DPC STEM observation of GaAs p-n junctionSatoko Toyama, Yoshifumi Kojima, Ayumu Oyaizu, et al.
Pageof 1