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B Cretin

Showing results (1-10 of 18) with videos related to

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The Review of Scientific Instruments|April 7, 2007
Near-infrared thermography using a charge-coupled device camera: application to microsystemsD Teyssieux, L Thiery, B Cretin
Revue Neurologique|May 22, 2018
Postictal pure retrograde amnesiaT Paratte, B Cretin, F Sellal
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|August 2, 2001
Finite element analysis of the behavior of the Scanning Microdeformation MicroscopeP Vairac, S Ballandras, B Cretin
Revue Neurologique|June 25, 2019
Benign syndrome of transient epileptic amnesia: Good outcome after 67 years of follow-upB Cretin, N Philippi, L Dibitonto, et al.
Revue Neurologique|October 5, 2010
[Sepsis associated encephalopathy]B Cretin, N Collongues, N Philippi, et al.
The Review of Scientific Instruments|April 2, 2008
Piezoelectric and optical setup to measure an electrical field: application to the longitudinal near-field generated by a tapered coaxS Euphrasie, P Vairac, B Cretin, et al.
The Review of Scientific Instruments|September 4, 2007
Sensitive ultrasonic vibrometer for very low frequency applicationsB Cretin, P Vairac, N Jachez, et al.
Revue Neurologique|May 15, 2010
[Love and neurology]N Collongues, B Cretin, J de Seze, et al.
The Review of Scientific Instruments|April 2, 2008
Sensitivity optimization of the scanning microdeformation microscope and application to mechanical characterization of soft materialsJ Le Rouzic, P Vairac, B Cretin, et al.
Revue Neurologique|July 6, 2012
[Syndrome of transient epileptic amnesia and epileptic amnesic syndrome: the same entity?]B Cretin, C Davanture, N Longato, et al.
Pageof 2

Showing results (1-10 of 18) with videos related to

Sort By:
Pageof 2
The Review of Scientific Instruments|April 7, 2007
Near-infrared thermography using a charge-coupled device camera: application to microsystemsD Teyssieux, L Thiery, B Cretin
Revue Neurologique|May 22, 2018
Postictal pure retrograde amnesiaT Paratte, B Cretin, F Sellal
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|August 2, 2001
Finite element analysis of the behavior of the Scanning Microdeformation MicroscopeP Vairac, S Ballandras, B Cretin
Revue Neurologique|June 25, 2019
Benign syndrome of transient epileptic amnesia: Good outcome after 67 years of follow-upB Cretin, N Philippi, L Dibitonto, et al.
Revue Neurologique|October 5, 2010
[Sepsis associated encephalopathy]B Cretin, N Collongues, N Philippi, et al.
The Review of Scientific Instruments|April 2, 2008
Piezoelectric and optical setup to measure an electrical field: application to the longitudinal near-field generated by a tapered coaxS Euphrasie, P Vairac, B Cretin, et al.
The Review of Scientific Instruments|September 4, 2007
Sensitive ultrasonic vibrometer for very low frequency applicationsB Cretin, P Vairac, N Jachez, et al.
Revue Neurologique|May 15, 2010
[Love and neurology]N Collongues, B Cretin, J de Seze, et al.
The Review of Scientific Instruments|April 2, 2008
Sensitivity optimization of the scanning microdeformation microscope and application to mechanical characterization of soft materialsJ Le Rouzic, P Vairac, B Cretin, et al.
Revue Neurologique|July 6, 2012
[Syndrome of transient epileptic amnesia and epileptic amnesic syndrome: the same entity?]B Cretin, C Davanture, N Longato, et al.
Pageof 2