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B Jouffrey

Showing results (1-10 of 10) with videos related to

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Ultramicroscopy|July 23, 2003
Channeling, localization and the density matrix in inelastic electron scatteringP Schattschneider, B Jouffrey
Ultramicroscopy|April 3, 2001
Orientation dependence of ionization edges in EELSP Schattschneider, C Hébert, B Jouffrey
Ultramicroscopy|November 24, 2004
The magic angle: a solved mysteryB Jouffrey, P Schattschneider, C Hébert
Ultramicroscopy|December 1, 1976
Kodirex for high resolution electron microscopyD Dorignac, M E Maclachlan, B Jouffrey
Ultramicroscopy|November 12, 2002
The separation of surface and bulk contributions in ELNES spectraP Schattschneider, M Stöger, C Hébert, et al.
Ultramicroscopy|January 31, 2006
Polarization dependence in ELNES: influence of probe convergence, collector aperture and electron beam incidence angleJ C Le Bossé, T Epicier, B Jouffrey
Ultramicroscopy|August 29, 2006
ELNES at magic angle conditionsC Hébert, P Schattschneider, H Franco, et al.
Microscopy Research and Technique|February 15, 1992
Degradation, amorphization, and recrystallization of ion bombarded Si(111) surfaces studied by in situ reflection electron microscopy and reflection high energy electron diffraction techniquesA Claverie, J Beauvillain, J Fauré, et al.
Ultramicroscopy|March 30, 2004
HREM, FIM and tomographic atom probe investigation of Guinier-Preston zones in an Al-1.54at% Cu alloyM Karlík, A Bigot, B Jouffrey, et al.
Ultramicroscopy|September 6, 2002
Separation of pure elemental and oxygen influenced signal in ELNESM Stöger, P Schattschneider, L Y Wei, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|July 23, 2003
Channeling, localization and the density matrix in inelastic electron scatteringP Schattschneider, B Jouffrey
Ultramicroscopy|April 3, 2001
Orientation dependence of ionization edges in EELSP Schattschneider, C Hébert, B Jouffrey
Ultramicroscopy|November 24, 2004
The magic angle: a solved mysteryB Jouffrey, P Schattschneider, C Hébert
Ultramicroscopy|December 1, 1976
Kodirex for high resolution electron microscopyD Dorignac, M E Maclachlan, B Jouffrey
Ultramicroscopy|November 12, 2002
The separation of surface and bulk contributions in ELNES spectraP Schattschneider, M Stöger, C Hébert, et al.
Ultramicroscopy|January 31, 2006
Polarization dependence in ELNES: influence of probe convergence, collector aperture and electron beam incidence angleJ C Le Bossé, T Epicier, B Jouffrey
Ultramicroscopy|August 29, 2006
ELNES at magic angle conditionsC Hébert, P Schattschneider, H Franco, et al.
Microscopy Research and Technique|February 15, 1992
Degradation, amorphization, and recrystallization of ion bombarded Si(111) surfaces studied by in situ reflection electron microscopy and reflection high energy electron diffraction techniquesA Claverie, J Beauvillain, J Fauré, et al.
Ultramicroscopy|March 30, 2004
HREM, FIM and tomographic atom probe investigation of Guinier-Preston zones in an Al-1.54at% Cu alloyM Karlík, A Bigot, B Jouffrey, et al.
Ultramicroscopy|September 6, 2002
Separation of pure elemental and oxygen influenced signal in ELNESM Stöger, P Schattschneider, L Y Wei, et al.
Pageof 1