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B K Minhas

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Applied Optics|February 21, 2008
Ellipsometric Scatterometry for the Metrology of Sub-0.1- num-Linewidth StructuresB K Minhas, S A Coulombe, S S Naqvi, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|July 4, 2002
Metallic inductive and capacitive grids: theory and experimentB K Minhas, W Fan, K Agi, et al.
Physical Review Letters|February 9, 2005
Midinfrared resonant magnetic nanostructures exhibiting a negative permeabilityShuang Zhang, Wenjun Fan, B K Minhas, et al.
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Showing results (1-10 of 3) with videos related to

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Pageof 1
Applied Optics|February 21, 2008
Ellipsometric Scatterometry for the Metrology of Sub-0.1- num-Linewidth StructuresB K Minhas, S A Coulombe, S S Naqvi, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|July 4, 2002
Metallic inductive and capacitive grids: theory and experimentB K Minhas, W Fan, K Agi, et al.
Physical Review Letters|February 9, 2005
Midinfrared resonant magnetic nanostructures exhibiting a negative permeabilityShuang Zhang, Wenjun Fan, B K Minhas, et al.
Pageof 1