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B Mireux

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Bulletin Du Groupement International Pour La Recherche Scientifique En Stomatologie & Odontologie|July 4, 2012
Residual stress evaluation near bone implant interface using synchrotron diffractionH Citterio, B Mireux, A Benmarouanne, et al.
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Bulletin Du Groupement International Pour La Recherche Scientifique En Stomatologie & Odontologie|July 4, 2012
Residual stress evaluation near bone implant interface using synchrotron diffractionH Citterio, B Mireux, A Benmarouanne, et al.
Pageof 1