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B P Geiser

Showing results (1-10 of 6) with videos related to

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Ultramicroscopy|January 11, 2011
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomographyD J Larson, T J Prosa, B P Geiser, et al.
Journal of Microscopy|December 2, 2010
Evolution of tip shape during field evaporation of complex multilayer structuresE A Marquis, B P Geiser, T J Prosa, et al.
Ultramicroscopy|March 31, 2015
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materialsN Rolland, D J Larson, B P Geiser, et al.
Ultramicroscopy|December 15, 2010
Advances in the reconstruction of atom probe tomography dataB Gault, D Haley, F de Geuser, et al.
Journal of Microscopy|December 16, 2010
Improvements in planar feature reconstructions in atom probe tomographyD J Larson, B P Geiser, T J Prosa, et al.
Ultramicroscopy|March 10, 2015
Encapsulation method for atom probe tomography analysis of nanoparticlesD J Larson, A D Giddings, Y Wu, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|January 11, 2011
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomographyD J Larson, T J Prosa, B P Geiser, et al.
Journal of Microscopy|December 2, 2010
Evolution of tip shape during field evaporation of complex multilayer structuresE A Marquis, B P Geiser, T J Prosa, et al.
Ultramicroscopy|March 31, 2015
An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materialsN Rolland, D J Larson, B P Geiser, et al.
Ultramicroscopy|December 15, 2010
Advances in the reconstruction of atom probe tomography dataB Gault, D Haley, F de Geuser, et al.
Journal of Microscopy|December 16, 2010
Improvements in planar feature reconstructions in atom probe tomographyD J Larson, B P Geiser, T J Prosa, et al.
Ultramicroscopy|March 10, 2015
Encapsulation method for atom probe tomography analysis of nanoparticlesD J Larson, A D Giddings, Y Wu, et al.
Pageof 1