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The Review of Scientific Instruments
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December 2, 2011
Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties
H-S Liao, B-J Juang, W-C Chang, et al.
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of 1
Search research articles
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Showing results (1-10 of 1) with videos related to
Sort By:
Page
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The Review of Scientific Instruments
|
December 2, 2011
Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties
H-S Liao, B-J Juang, W-C Chang, et al.
Page
of 1