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Ben Carmichael

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Nanotechnology|September 16, 2016
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopyNina Balke, Stephen Jesse, Pu Yu, et al.
Nanotechnology|January 5, 2017
Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopyNina Balke, Stephen Jesse, Ben Carmichael, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Nanotechnology|September 16, 2016
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopyNina Balke, Stephen Jesse, Pu Yu, et al.
Nanotechnology|January 5, 2017
Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopyNina Balke, Stephen Jesse, Ben Carmichael, et al.
Pageof 1