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Sensors (Basel, Switzerland)
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November 11, 2022
Photometric-Stereo-Based Defect Detection System for Metal Parts
Yanlong Cao, Binjie Ding, Jingxi Chen, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
April 3, 2025
Revisiting Supervised Learning-Based Photometric Stereo Networks
Xiaoyao Wei, Zongrui Li, Binjie Ding, et al.
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of 1
Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Sensors (Basel, Switzerland)
|
November 11, 2022
Photometric-Stereo-Based Defect Detection System for Metal Parts
Yanlong Cao, Binjie Ding, Jingxi Chen, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
April 3, 2025
Revisiting Supervised Learning-Based Photometric Stereo Networks
Xiaoyao Wei, Zongrui Li, Binjie Ding, et al.
Page
of 1