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Biwei Wu

Showing results (1-10 of 10) with videos related to

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Optics Letters|October 1, 2021
Deep learning enables confocal laser-scanning microscopy with enhanced resolutionWeibo Wang, Biwei Wu, Baoyuan Zhang, et al.
Frontiers in Chemistry|April 25, 2022
Circular Dichroism Second-Harmonic Generation Imaging of KTiOPO<sub>4</sub> Nanocrystal Through Stratified MediaBiwei Wu, Keyi Wu, Xuefeng Sun, et al.
Optics Express|September 10, 2020
Correction of refractive index mismatch-induced aberrations under radially polarized illumination by deep learningWeibo Wang, Biwei Wu, Baoyuan Zhang, et al.
Optics Express|August 13, 2025
Rigorous vector-diffraction-based spectral signal model for thickness measurement in chromatic confocal microscopyZhiqiang Zhang, Biwei Wu, Yuxiang Cai, et al.
Optics Express|May 4, 2026
Modeling of alignment errors induced by secondary reflection stray light and suppression based on angular spectrum expansionPeiyu Song, Weibo Wang, Biwei Wu, et al.
Optics Express|September 11, 2019
Rigorous modelling of second harmonic generation imaging through stratified media focused by radially polarized beamsWeibo Wang, Biwei Wu, Shiyi Lin, et al.
Optics Express|April 27, 2022
Simulation-driven learning: a deep learning approach for image scanning microscopy via physical imaging modelsBaoyuan Zhang, Xuefeng Sun, Hongxia Yang, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Adaptive Weighted Error-Correction Method Based on the Error Distribution Characteristics of Multi-Channel AlignmentPeiyu Song, Weibo Wang, Biwei Wu, et al.
Optics Express|December 31, 2020
Image scanning microscopy with a long depth of focus generated by an annular radially polarized beamWeibo Wang, Baoyuan Zhang, Biwei Wu, et al.
Optics Express|September 23, 2025
Prebiased peak extraction algorithm with linear error compensation for chromatic confocal microscopyZhiqiang Zhang, Yuetong Chang, Guangming Xia, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Optics Letters|October 1, 2021
Deep learning enables confocal laser-scanning microscopy with enhanced resolutionWeibo Wang, Biwei Wu, Baoyuan Zhang, et al.
Frontiers in Chemistry|April 25, 2022
Circular Dichroism Second-Harmonic Generation Imaging of KTiOPO<sub>4</sub> Nanocrystal Through Stratified MediaBiwei Wu, Keyi Wu, Xuefeng Sun, et al.
Optics Express|September 10, 2020
Correction of refractive index mismatch-induced aberrations under radially polarized illumination by deep learningWeibo Wang, Biwei Wu, Baoyuan Zhang, et al.
Optics Express|August 13, 2025
Rigorous vector-diffraction-based spectral signal model for thickness measurement in chromatic confocal microscopyZhiqiang Zhang, Biwei Wu, Yuxiang Cai, et al.
Optics Express|May 4, 2026
Modeling of alignment errors induced by secondary reflection stray light and suppression based on angular spectrum expansionPeiyu Song, Weibo Wang, Biwei Wu, et al.
Optics Express|September 11, 2019
Rigorous modelling of second harmonic generation imaging through stratified media focused by radially polarized beamsWeibo Wang, Biwei Wu, Shiyi Lin, et al.
Optics Express|April 27, 2022
Simulation-driven learning: a deep learning approach for image scanning microscopy via physical imaging modelsBaoyuan Zhang, Xuefeng Sun, Hongxia Yang, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Adaptive Weighted Error-Correction Method Based on the Error Distribution Characteristics of Multi-Channel AlignmentPeiyu Song, Weibo Wang, Biwei Wu, et al.
Optics Express|December 31, 2020
Image scanning microscopy with a long depth of focus generated by an annular radially polarized beamWeibo Wang, Baoyuan Zhang, Biwei Wu, et al.
Optics Express|September 23, 2025
Prebiased peak extraction algorithm with linear error compensation for chromatic confocal microscopyZhiqiang Zhang, Yuetong Chang, Guangming Xia, et al.
Pageof 1