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Metrologia
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January 17, 2017
Transfer Standard Uncertainty Can Cause Inconclusive Inter-Laboratory Comparisons
John Wright, Blaza Toman, Bodo Mickan, et al.
Sensors (Basel, Switzerland)
|
March 27, 2019
Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm
Uwe Brand, Min Xu, Lutz Doering, et al.
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Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Metrologia
|
January 17, 2017
Transfer Standard Uncertainty Can Cause Inconclusive Inter-Laboratory Comparisons
John Wright, Blaza Toman, Bodo Mickan, et al.
Sensors (Basel, Switzerland)
|
March 27, 2019
Long Slender Piezo-Resistive Silicon Microprobes for Fast Measurements of Roughness and Mechanical Properties inside Micro-Holes with Diameters below 100 µm
Uwe Brand, Min Xu, Lutz Doering, et al.
Page
of 1