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Ultramicroscopy|April 24, 2026
Unsupervised denoising of STEM images for enhanced atomic quantificationYucong Wu, Ziyang Huang, Honglue Chen, et al.
Nano Letters|June 4, 2024
Modulating the Structure and Optoelectronic Properties of Solution-Processed Bismuth-Based NanocrystalsYujie Yang, Bohua He, Zhenglin Jia, et al.
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