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The Review of Scientific Instruments|October 20, 2023
Customization of an atomic force microscope for multidimensional measurements under environmental conditionsBugrahan Guner, Simon Laflamme, Omur E DagdevirenThe Journal of Physical Chemistry Letters|December 4, 2025
Standardizing Force Reconstruction in Dynamic Atomic Force MicroscopySimon Laflamme, Bugrahan Guner, Omur E DagdevirenCommunications Materials|February 11, 2026
Insight into the Ehrlich-Schwoebel barrier via three-dimensional atomic force microscopy mapping of surface potentials on Au (111)Bugrahan Guner, Mehmet Z Baykara, Omur E DagdevirenCommunications Chemistry|March 17, 2025
Ultraviolet irradiation penetration depth on TiO2Bugrahan Guner, Mohammad Safikhani-Mahmoudi, Fengmiao Li, et al.The Review of Scientific Instruments|July 10, 2021
Confronting interatomic force measurementsOmur E DagdevirenNanotechnology|May 15, 2018
Exploring load, velocity, and surface disorder dependence of friction with one-dimensional and two-dimensional modelsOmur E DagdevirenThe Review of Scientific Instruments|April 1, 2019
Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distanceOmur E Dagdeviren, Udo D SchwarzBeilstein Journal of Nanotechnology|May 3, 2017
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysisOmur E Dagdeviren, Udo D SchwarzThe Review of Scientific Instruments|February 3, 2019
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensorsOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.Sensors (Basel, Switzerland)|October 20, 2019
Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe MicroscopyOmur E Dagdeviren, Yoichi Miyahara, Aaron Mascaro, et al.Pageof 5