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Optics Express|June 21, 2012
Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laserSaerom Maeng, Jungjae Park, Byungsung O, et al.
Nanoscale Research Letters|September 8, 2012
Structural variations of Si1-xCx and their light absorption controllabilityJihyun Moon, Seung Jae Baik, Byungsung O, et al.
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