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Optics Letters|November 3, 2009
Angle-resolved polarimetric phase measurement for the characterization of gratingsH Giovannini, C Deumié, H Akhouayri, et al.Optics Express|March 14, 2013
Light enpolarization by disordered media under partial polarized illumination: the role of cross-scattering coefficientsM Zerrad, G Soriano, A Ghabbach, et al.Optics Express|April 4, 2024
Thermal radiation transferred to the guided modes of optical interference coatingsP Rouquette, C Amra, M Zerrad, et al.Applied Optics|December 4, 2010
Multiscale roughness in optical multilayers: atomic force microscopy and light scatteringC Deumié, R Richier, P Dumas, et al.Optics Express|July 1, 2014
Accurate metrology of polarization curves measured at the speckle size of visible light scatteringA Ghabbach, M Zerrad, G Soriano, et al.Optics Express|November 24, 2011
Enpolarization of light by scattering mediaJ Sorrentini, M Zerrad, G Soriano, et al.Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 11, 2013
Surface and bulk scattering by magnetic and dielectric inhomogeneities: a first-order methodÉ Dieudonné, N Malléjac, C Amra, et al.Optics Express|June 24, 2009
An alternative scattering method to characterize surface roughness from transparent substratesM Zerrad, C Deumié, M Lequime, et al.Applied Optics|November 25, 2010
Characterization of optical coatings by photothermal deflectionM Commandré, P RochePageof 35