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Physical Review Letters|April 17, 2002

Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffractionD E Eastman, C B Stagarescu, G Xu, et al.

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Physical Review Letters|April 17, 2002

Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffractionD E Eastman, C B Stagarescu, G Xu, et al.

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