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C Deumié

Showing results (1-10 of 7) with videos related to

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International Journal of Cosmetic Science|June 4, 2014
Sun protection and hydration of stratum corneum: a study by 2-D differential methodM Lécureux, C Deumié, S Enoch
Optics Express|June 2, 2009
Optical properties calculated for multidielectric quarter-wave coatings on microspheresPhilippe Voarino, C Deumié, C Amra
Applied Optics|December 4, 2010
Ellipsometry of light scattering from multilayer coatingsC Deumié, H Giovannini, C Amra
Applied Optics|December 4, 2010
Multiscale roughness in optical multilayers: atomic force microscopy and light scatteringC Deumié, R Richier, P Dumas, et al.
Optics Letters|November 3, 2009
Angle-resolved polarimetric phase measurement for the characterization of gratingsH Giovannini, C Deumié, H Akhouayri, et al.
Optics Express|June 24, 2009
An alternative scattering method to characterize surface roughness from transparent substratesM Zerrad, C Deumié, M Lequime, et al.
Optics Express|April 1, 2009
An enhanced contrast to detect bulk objects under arbitrary rough surfacesL Arnaud, G Georges, J Sorrentini, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
International Journal of Cosmetic Science|June 4, 2014
Sun protection and hydration of stratum corneum: a study by 2-D differential methodM Lécureux, C Deumié, S Enoch
Optics Express|June 2, 2009
Optical properties calculated for multidielectric quarter-wave coatings on microspheresPhilippe Voarino, C Deumié, C Amra
Applied Optics|December 4, 2010
Ellipsometry of light scattering from multilayer coatingsC Deumié, H Giovannini, C Amra
Applied Optics|December 4, 2010
Multiscale roughness in optical multilayers: atomic force microscopy and light scatteringC Deumié, R Richier, P Dumas, et al.
Optics Letters|November 3, 2009
Angle-resolved polarimetric phase measurement for the characterization of gratingsH Giovannini, C Deumié, H Akhouayri, et al.
Optics Express|June 24, 2009
An alternative scattering method to characterize surface roughness from transparent substratesM Zerrad, C Deumié, M Lequime, et al.
Optics Express|April 1, 2009
An enhanced contrast to detect bulk objects under arbitrary rough surfacesL Arnaud, G Georges, J Sorrentini, et al.
Pageof 1