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C F Kisielowski

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Micron (Oxford, England : 1993)|September 24, 2014
Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivityS Helveg, C F Kisielowski, J R Jinschek, et al.
Journal of Microscopy|May 28, 2008
Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopyK Mahalingam, K G Eyink, G J Brown, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Micron (Oxford, England : 1993)|September 24, 2014
Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivityS Helveg, C F Kisielowski, J R Jinschek, et al.
Journal of Microscopy|May 28, 2008
Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopyK Mahalingam, K G Eyink, G J Brown, et al.
Pageof 1