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Ultramicroscopy|March 13, 2018
Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparationJ Bogdanowicz, A Kumar, C Fleischmann, et al.
Ultramicroscopy|May 2, 2017
Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefactsD Melkonyan, C Fleischmann, L Arnoldi, et al.
Ultramicroscopy|December 15, 2017
Wet-chemical etching of atom probe tips for artefact free analyses of nanoscaled semiconductor structuresD Melkonyan, C Fleischmann, A Veloso, et al.
Der Internist|September 25, 2019
[Periodic fever and pancytopenia in a 35-year-old patient]M Schmutz, T Schaller, B Kubuschok, et al.
Leukemia Research|November 16, 2004
Germline mutations in Dok1 do not predispose to chronic lymphocytic leukemiaG S Sellick, R J Coleman, R V Talaban, et al.
ACS Applied Materials & Interfaces|March 7, 2014
Relaxor ferroelectricity and magnetoelectric coupling in ZnO-Co nanocomposite thin films: beyond multiferroic compositesD Y Li, Y J Zeng, D Batuk, et al.
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