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Applied Optics
|
June 26, 2010
Use of objective lenses with slit pupil functions in the imaging of line structures
T Wilson, S J Hewlett, C J Sheppard
Applied Optics
|
July 15, 1986
Surface profiling by phase-locked interferometry
H J Matthews, D K Hamilton, C J Sheppard
Applied Optics
|
September 24, 2010
Influence of spherical aberration on axial imaging of confocal reflection microscopy
C J Sheppard, M Gu, K Brain, et al.
Applied Optics
|
March 1, 1984
Edge detection in micrometrology with nearly confocal microscopy
C J Sheppard, I J Cox, D K Hamilton
Applied Optics
|
September 24, 2010
Confocal imaging of a stratified medium
C J Sheppard, T J Connolly, J Lee, et al.
Applied Optics
|
March 6, 2008
Focal-length measurement by multiple-beam shearing interferometry
K Matsuda, T H Barnes, B F Oreb, et al.
Applied Optics
|
March 21, 2008
Real-time phase-difference amplification with a liquid-crystal spatial light modulator
K Matsuda, G T Bold, T H Barnes, et al.
Applied Optics
|
March 8, 2008
Straightness measurements by use of a reflection confocal optical system
K Matsuda, M Roy, J W O'Byrne, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
January 19, 2023
120 MeV swift Au<sup>9+</sup>ion induced phase transition in ZrO<sub>2</sub>: monoclinic to tetragonal and cubic to tetragonal structure
H S Lokesha, K R Nagabhushana, Fouran Singh, et al.
Nanotechnology
|
March 28, 2020
Role of Ni substitution on structural, magnetic and electronic properties of epitaxial CoCr<sub>2</sub>O<sub>4</sub> spinel thin films
P Mohanty, S Chowdhury, R J Choudhary, et al.
Page
of 5
Search research articles
Search
Showing results (41-50 of 50) with videos related to
Sort By:
Page
of 5
You have reached the last page of results.
This site can display upto 50 results.
Applied Optics
|
June 26, 2010
Use of objective lenses with slit pupil functions in the imaging of line structures
T Wilson, S J Hewlett, C J Sheppard
Applied Optics
|
July 15, 1986
Surface profiling by phase-locked interferometry
H J Matthews, D K Hamilton, C J Sheppard
Applied Optics
|
September 24, 2010
Influence of spherical aberration on axial imaging of confocal reflection microscopy
C J Sheppard, M Gu, K Brain, et al.
Applied Optics
|
March 1, 1984
Edge detection in micrometrology with nearly confocal microscopy
C J Sheppard, I J Cox, D K Hamilton
Applied Optics
|
September 24, 2010
Confocal imaging of a stratified medium
C J Sheppard, T J Connolly, J Lee, et al.
Applied Optics
|
March 6, 2008
Focal-length measurement by multiple-beam shearing interferometry
K Matsuda, T H Barnes, B F Oreb, et al.
Applied Optics
|
March 21, 2008
Real-time phase-difference amplification with a liquid-crystal spatial light modulator
K Matsuda, G T Bold, T H Barnes, et al.
Applied Optics
|
March 8, 2008
Straightness measurements by use of a reflection confocal optical system
K Matsuda, M Roy, J W O'Byrne, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
January 19, 2023
120 MeV swift Au<sup>9+</sup>ion induced phase transition in ZrO<sub>2</sub>: monoclinic to tetragonal and cubic to tetragonal structure
H S Lokesha, K R Nagabhushana, Fouran Singh, et al.
Nanotechnology
|
March 28, 2020
Role of Ni substitution on structural, magnetic and electronic properties of epitaxial CoCr<sub>2</sub>O<sub>4</sub> spinel thin films
P Mohanty, S Chowdhury, R J Choudhary, et al.
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of 5