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Applied Optics|June 22, 2010
Contouring by electronic speckle pattern interferometry employing dual beam illuminationC Joenathan, B Pfister, H J TizianiApplied Optics|October 14, 2010
Oblique incidence and observation electronic speckle-pattern interferometryC Joenathan, B Franze, H J TizianiApplied Optics|February 29, 2008
Speckle interferometry with temporal phase evaluation: influence of decorrelation, speckle size, and nonlinearity of the cameraC Joenathan, P Haible, H J TizianiApplied Optics|February 15, 2008
Speckle interferometry with temporal phase evaluation for measuring large-object deformationC Joenathan, B Franze, P Haible, et al.Applied Optics|February 15, 2008
Shape Measurement by use of Temporal Fourier transformation in Dual-Beam Illumination Speckle InterferometryC Joenathan, B Franze, P Haible, et al.Applied Optics|August 19, 2010
Vibration fringes by phase stepping on an electronic speckle pattern interferometer: an analysisC JoenathanApplied Optics|October 12, 2010
Phase-measuring interferometry: new methods and error analysisC JoenathanApplied Optics|June 29, 2010
Modified electronic speckle pattern interferometer employing an off-axis reference beamC Joenathan, R TorrobaOptics Letters|September 23, 2009
Simple electronic speckle-shearing-pattern interferometerC Joenathan, R TorrobaPageof 13