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Optics Letters|October 2, 2009
Quasi-equal-path electronic speckle pattern interferometric systemS Peng, C Joenathan, B M KhoranaApplied Optics|February 29, 2008
Speckle interferometry with temporal phase evaluation: influence of decorrelation, speckle size, and nonlinearity of the cameraC Joenathan, P Haible, H J TizianiApplied Optics|August 31, 2010
Pulsed lasers in speckle photography: error owing to pulse widthC Joenathan, S M Blair, A R GanesanOptics Letters|September 2, 2009
Speckle interferometric methods of measuring small out-of-plane displacementsR K Mohanty, C Joenathan, R S SirohiOptics Letters|September 5, 2009
Contouring by speckle interferometryC Joenathan, R K Mohanty, R S SirohiApplied Optics|February 15, 2008
Speckle interferometry with temporal phase evaluation for measuring large-object deformationC Joenathan, B Franze, P Haible, et al.Applied Optics|February 15, 2008
Shape Measurement by use of Temporal Fourier transformation in Dual-Beam Illumination Speckle InterferometryC Joenathan, B Franze, P Haible, et al.Applied Optics|March 10, 2018
Nanoscale tilt measurement using a cyclic interferometer with polarization phase stepping and multiple reflectionsC Joenathan, T Naderishahab, A Bernal, et al.Applied Optics|August 19, 2010
Spatial image differentiation using programmable binary optical elementsJ A Davis, W V Brandt, D M Cottrell, et al.Pageof 2