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Angewandte Chemie (International Ed. in English)|August 31, 2002
Adhesion Forces between Lewis(X) Determinant Antigens as Measured by Atomic Force MicroscopyC Tromas, J Rojo, J M de la Fuente, et al.
The Review of Scientific Instruments|November 5, 2013
An experimental UHV AFM-STM device for characterizing surface nanostructures under stress/strain at variable temperatureY Nahas, F Berneau, J Bonneville, et al.
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