Search research articles
Contact Us
Filters
Showing results (1-10 of 24) with videos related to
Page
of 3
Sort By:
Optics Letters
|
August 3, 2011
Absolute metrology by phase and frequency modulation for multiwavelength interferometry
Konstantinos Falaggis, Catherine E Towers
Applied Optics
|
October 22, 2011
Method of excess fractions with application to absolute distance metrology: theoretical analysis
Konstantinos Falaggis, David P Towers, Catherine E Towers
Applied Optics
|
August 14, 2013
Method of excess fractions with application to absolute distance metrology: analytical solution
Konstantinos Falaggis, David P Towers, Catherine E Towers
Applied Optics
|
October 4, 2012
Method of excess fractions with application to absolute distance metrology: wavelength selection and the effects of common error sources
Konstantinos Falaggis, David P Towers, Catherine E Towers
Applied Optics
|
August 23, 2007
Uneven fringe projection for efficient calibration in high-resolution 3D shape metrology
Zonghua Zhang, Catherine E Towers, David P Towers
Applied Optics
|
June 13, 2014
Algebraic solution for phase unwrapping problems in multiwavelength interferometry
Konstantinos Falaggis, David P Towers, Catherine E Towers
Optics Express
|
June 12, 2009
Time efficient color fringe projection system for 3D shape and color using optimum 3-frequency Selection
Zonghua Zhang, Catherine E Towers, David P Towers
Optics Letters
|
April 3, 2009
Multiwavelength interferometry: extended range metrology
Konstantinos Falaggis, David P Towers, Catherine E Towers
Optics Letters
|
July 6, 2004
Generalized frequency selection in multifrequency interferometry
Catherine E Towers, David P Towers, Julian D C Jones
Optics Letters
|
June 21, 2003
Optimum frequency selection in multifrequency interferometry
Catherine E Towers, David P Towers, Julian D C Jones
Page
of 3
Search research articles
Search
Showing results (1-10 of 24) with videos related to
Sort By:
Page
of 3
Optics Letters
|
August 3, 2011
Absolute metrology by phase and frequency modulation for multiwavelength interferometry
Konstantinos Falaggis, Catherine E Towers
Applied Optics
|
October 22, 2011
Method of excess fractions with application to absolute distance metrology: theoretical analysis
Konstantinos Falaggis, David P Towers, Catherine E Towers
Applied Optics
|
August 14, 2013
Method of excess fractions with application to absolute distance metrology: analytical solution
Konstantinos Falaggis, David P Towers, Catherine E Towers
Applied Optics
|
October 4, 2012
Method of excess fractions with application to absolute distance metrology: wavelength selection and the effects of common error sources
Konstantinos Falaggis, David P Towers, Catherine E Towers
Applied Optics
|
August 23, 2007
Uneven fringe projection for efficient calibration in high-resolution 3D shape metrology
Zonghua Zhang, Catherine E Towers, David P Towers
Applied Optics
|
June 13, 2014
Algebraic solution for phase unwrapping problems in multiwavelength interferometry
Konstantinos Falaggis, David P Towers, Catherine E Towers
Optics Express
|
June 12, 2009
Time efficient color fringe projection system for 3D shape and color using optimum 3-frequency Selection
Zonghua Zhang, Catherine E Towers, David P Towers
Optics Letters
|
April 3, 2009
Multiwavelength interferometry: extended range metrology
Konstantinos Falaggis, David P Towers, Catherine E Towers
Optics Letters
|
July 6, 2004
Generalized frequency selection in multifrequency interferometry
Catherine E Towers, David P Towers, Julian D C Jones
Optics Letters
|
June 21, 2003
Optimum frequency selection in multifrequency interferometry
Catherine E Towers, David P Towers, Julian D C Jones
Page
of 3