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Applied Optics|January 12, 2008
Depth profiling of ion implanted materials with skewed doping distributions using Fourier transform infrared spectroscopyCharalambos C KatsidisApplied Optics|July 9, 2002
General transfer-matrix method for optical multilayer systems with coherent, partially coherent, and incoherent interferenceCharalambos C Katsidis, Dimitrios I SiapkasPageof 1