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Applied Optics|October 24, 2007
Polarization-based index of refraction and reflection angle estimation for remote sensing applicationsVimal Thilak, David G Voelz, Charles D CreusereIEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|June 15, 2010
Passive polarimetric imagery-based material classification robust to illumination source position and viewpointThilakam Vimal Thilak Krishna, Charles D Creusere, David G VoelzPageof 1