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Journal of Research of the National Institute of Standards and Technology|August 10, 2016
Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force MicroscopyShaw C Feng, Che Bong Joung, Theodore V VorburgerScanning|January 18, 2008
Computational models of a nano probe tip for static behaviorsShaw C Feng, Theodore V Vorburger, Che Bong Joung, et al.Pageof 1