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Peerj. Computer Science|September 24, 2025
Data trace as the scientific foundation for trusted metrological data: a review for future metrology directionZhanshuo Cao, Boyong Gao, Zilong Liu, et al.
Scientific Data|July 17, 2026
RFDD: A High-Quality Dataset based on Metrology for Fastener Defect Detection in High-Speed RailwaysBin Wang, Chenbo Pei, Xingchuang Xiong, et al.
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