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Cheolsu Han

Showing results (1-10 of 6) with videos related to

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The Review of Scientific Instruments|June 7, 2011
Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopyCheolsu Han, Chung Choo Chung
The Review of Scientific Instruments|March 3, 2017
Edge shadow projection method for measuring the brightness of electron gunsCheolsu Han, Inho Sul, Boklae Cho
The Review of Scientific Instruments|August 7, 2009
Automatic approaching method for atomic force microscope using a Gaussian laser beamCheolsu Han, Haiwon Lee, Chung Choo Chung
Nanotechnology|September 7, 2010
Atomic force microscope anodization lithography using pulsed bias voltage synchronized with resonance frequency of cantileverSukjong Bae, Cheolsu Han, Moo-Sub Kim, et al.
The Review of Scientific Instruments|February 2, 2015
Note: O-ring stack system for electron gun alignmentIn-Yong Park, Boklae Cho, Cheolsu Han, et al.
Ultramicroscopy|July 3, 2007
Feasibility of multi-walled carbon nanotube probes in AFM anodization lithographyJi Sun Choi, Sukjong Bae, Sang Jung Ahn, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|June 7, 2011
Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopyCheolsu Han, Chung Choo Chung
The Review of Scientific Instruments|March 3, 2017
Edge shadow projection method for measuring the brightness of electron gunsCheolsu Han, Inho Sul, Boklae Cho
The Review of Scientific Instruments|August 7, 2009
Automatic approaching method for atomic force microscope using a Gaussian laser beamCheolsu Han, Haiwon Lee, Chung Choo Chung
Nanotechnology|September 7, 2010
Atomic force microscope anodization lithography using pulsed bias voltage synchronized with resonance frequency of cantileverSukjong Bae, Cheolsu Han, Moo-Sub Kim, et al.
The Review of Scientific Instruments|February 2, 2015
Note: O-ring stack system for electron gun alignmentIn-Yong Park, Boklae Cho, Cheolsu Han, et al.
Ultramicroscopy|July 3, 2007
Feasibility of multi-walled carbon nanotube probes in AFM anodization lithographyJi Sun Choi, Sukjong Bae, Sang Jung Ahn, et al.
Pageof 1