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Chergn-En Sun

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ACS Applied Materials & Interfaces|March 18, 2015
ZnO/NiO diode-based charge-trapping layer for flash memory featuring low-voltage operationChergn-En Sun, Chin-Yu Chen, Ka-Lip Chu, et al.
ACS Applied Materials & Interfaces|April 30, 2015
Correction to ZnO/NiO Diode-Based Charge Trapping Layer for Flash Memory Featuring Low Voltage OperationChergn-En Sun, Chin-Yu Chen, Ka-Lip Chu, et al.
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Showing results (1-10 of 2) with videos related to

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ACS Applied Materials & Interfaces|March 18, 2015
ZnO/NiO diode-based charge-trapping layer for flash memory featuring low-voltage operationChergn-En Sun, Chin-Yu Chen, Ka-Lip Chu, et al.
ACS Applied Materials & Interfaces|April 30, 2015
Correction to ZnO/NiO Diode-Based Charge Trapping Layer for Flash Memory Featuring Low Voltage OperationChergn-En Sun, Chin-Yu Chen, Ka-Lip Chu, et al.
Pageof 1