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Journal of Synchrotron Radiation|April 26, 2014
Characterization of an in-vacuum PILATUS 1M detectorJan Wernecke, Christian Gollwitzer, Peter Müller, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|December 18, 2015
Size Determination of a Liposomal Drug by Small-Angle X-ray Scattering Using Continuous Contrast VariationRaul Garcia-Diez, Christian Gollwitzer, Michael Krumrey, et al.
Physical Review. E|May 14, 2016
Retarding the growth of the Rosensweig instability unveils a new scaling regimeAdrian Lange, Christian Gollwitzer, Robin Maretzki, et al.
The Review of Scientific Instruments|November 30, 2019
Fully experiment-based evaluation of few digital volume correlation techniquesBartosz Powierza, Christian Gollwitzer, Dagmar Wolgast, et al.
Toxicology Research|August 10, 2018
Changes in silica nanoparticles upon internalisation by cells: size, aggregation/agglomeration state, mass- and number-based concentrationsDorota Bartczak, Julie Davies, Christian Gollwitzer, et al.
Analytical Chemistry|November 13, 2024
Adding More Shape to Nanoscale Reference Materials─LiYF<sub>4</sub>:Yb,Tm Bipyramids as Standards for Sizing Methods and Particle Number ConcentrationJérôme Deumer, Elina Andresen, Christian Gollwitzer, et al.
The Journal of Chemical Physics|May 2, 2008
Measuring the deformation of a ferrogel sphere in a homogeneous magnetic fieldChristian Gollwitzer, Alexander Turanov, Marina Krekhova, et al.
Applied Optics|December 18, 2023
Bilayer and trilayer X-ray mirror coatings containing W, Pt, or Ir, in combination with C, C/Co, B<sub>4</sub>C, or B<sub>4</sub>C/Ni: X-ray reflectance, film stress, and temporal stabilityDavid L Windt, Raymond P Conley, Eric M Gullikson, et al.
Journal of Applied Crystallography|August 17, 2022
Small-angle X-ray scattering: characterization of cubic Au nanoparticles using Debye's scattering formulaJérôme Deumer, Brian R Pauw, Sylvie Marguet, et al.
Optics Letters|November 4, 2025
HiPIMS deposition method unlocks higher X-ray reflectance in ultra-short-period multilayer mirrorsCorentin Nannini, Nolann Ravinet, Evgueni Meltchakov, et al.
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