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Christian Mühlig

Showing results (1-10 of 9) with videos related to

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Applied Optics|February 12, 2014
Enhanced laser-induced deflection measurements for low absorbing highly reflecting mirrorsChristian Mühlig, Simon Bublitz, Wolfgang Paa
Applied Optics|December 17, 2009
Nonlinear absorption in single LaF(3) and MgF(2) layers at 193 nm measured by surface sensitive laser induced deflection techniqueChristian Mühlig, Simon Bublitz, Siegfried Kufert
Applied Optics|April 5, 2011
Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental resultsChristian Mühlig, Siegfried Kufert, Simon Bublitz, et al.
Applied Optics|February 4, 2017
Effect of ion beam figuring and subsequent antireflective coating deposition on the surface absorption of CaF<sub>2</sub> at 193  nmChristian Mühlig, Simon Bublitz, Roman Feldkamp, et al.
Applied Optics|May 2, 2008
Characterization of low losses in optical thin films and materialsChristian Mühlig, Wolfgang Triebel, Siegfried Kufert, et al.
Applied Optics|March 17, 2026
Optical interference coatings: measurement challenge 2025 [Invited]Christian Mühlig, Florian Carstens, Thomas Gischkat, et al.
Optics Express|April 27, 2022
Effect of annealing on properties and performance of HfO<sub>2</sub>/SiO<sub>2</sub> optical coatings for UV-applicationsMatthias Falmbigl, Kyle Godin, Jason George, et al.
Applied Optics|March 17, 2026
Optical losses in SiN<sub>x</sub> and SiO<sub>x</sub>N<sub>y</sub> coatings deposited by plasma-enhanced chemical vapor deposition for gravitational wave detectorsKirstin Saunders, Tobias Herffurth, Simon Bublitz, et al.
ACS Applied Materials & Interfaces|March 21, 2022
Plasma-Enhanced Atomic Layer Deposition of HfO<sub>2</sub> with Substrate Biasing: Thin Films for High-Reflective MirrorsVivek Beladiya, Tahsin Faraz, Paul Schmitt, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Applied Optics|February 12, 2014
Enhanced laser-induced deflection measurements for low absorbing highly reflecting mirrorsChristian Mühlig, Simon Bublitz, Wolfgang Paa
Applied Optics|December 17, 2009
Nonlinear absorption in single LaF(3) and MgF(2) layers at 193 nm measured by surface sensitive laser induced deflection techniqueChristian Mühlig, Simon Bublitz, Siegfried Kufert
Applied Optics|April 5, 2011
Laser induced deflection technique for absolute thin film absorption measurement: optimized concepts and experimental resultsChristian Mühlig, Siegfried Kufert, Simon Bublitz, et al.
Applied Optics|February 4, 2017
Effect of ion beam figuring and subsequent antireflective coating deposition on the surface absorption of CaF<sub>2</sub> at 193  nmChristian Mühlig, Simon Bublitz, Roman Feldkamp, et al.
Applied Optics|May 2, 2008
Characterization of low losses in optical thin films and materialsChristian Mühlig, Wolfgang Triebel, Siegfried Kufert, et al.
Applied Optics|March 17, 2026
Optical interference coatings: measurement challenge 2025 [Invited]Christian Mühlig, Florian Carstens, Thomas Gischkat, et al.
Optics Express|April 27, 2022
Effect of annealing on properties and performance of HfO<sub>2</sub>/SiO<sub>2</sub> optical coatings for UV-applicationsMatthias Falmbigl, Kyle Godin, Jason George, et al.
Applied Optics|March 17, 2026
Optical losses in SiN<sub>x</sub> and SiO<sub>x</sub>N<sub>y</sub> coatings deposited by plasma-enhanced chemical vapor deposition for gravitational wave detectorsKirstin Saunders, Tobias Herffurth, Simon Bublitz, et al.
ACS Applied Materials & Interfaces|March 21, 2022
Plasma-Enhanced Atomic Layer Deposition of HfO<sub>2</sub> with Substrate Biasing: Thin Films for High-Reflective MirrorsVivek Beladiya, Tahsin Faraz, Paul Schmitt, et al.
Pageof 1