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Scientific Reports
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January 30, 2025
An applied noise model for scintillation-based CCD detectors in transmission electron microscopy
Christian Zietlow, Jörg K N Lindner
Ultramicroscopy
|
January 17, 2025
An applied noise model for low-loss EELS maps
Christian Zietlow, Jörg K N Lindner
Ultramicroscopy
|
May 21, 2025
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps
Christian Zietlow, Jörg K N Lindner
Page
of 1
Search research articles
Search
Showing results (1-10 of 3) with videos related to
Sort By:
Page
of 1
Scientific Reports
|
January 30, 2025
An applied noise model for scintillation-based CCD detectors in transmission electron microscopy
Christian Zietlow, Jörg K N Lindner
Ultramicroscopy
|
January 17, 2025
An applied noise model for low-loss EELS maps
Christian Zietlow, Jörg K N Lindner
Ultramicroscopy
|
May 21, 2025
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps
Christian Zietlow, Jörg K N Lindner
Page
of 1