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Ultramicroscopy|July 5, 2015
Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Ultramicroscopy|May 22, 2018
Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergenceTim Grieb, Florian F Krause, Marco Schowalter, et al.
Ultramicroscopy|October 7, 2018
Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffractionChristoph Mahr, Knut Müller-Caspary, Robert Ritz, et al.
Ultramicroscopy|June 27, 2021
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detectionTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.
Chemical Reviews|May 3, 2023
Nanoporous Gold: From Structure Evolution to Functional Properties in Catalysis and ElectrochemistryGunther Wittstock, Marcus Bäumer, Wilke Dononelli, et al.
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