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Scientific Reports|September 16, 2014
Evidence of dislocation cross-slip in MAX phase deformed at high temperatureAntoine Guitton, Anne Joulain, Ludovic Thilly, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|June 29, 2005
Structural characterization of self-assembled monolayers of neoglycoconjugates using atomic force microscopyChristophe Tromas, Peter Eaton, Jean Mimault, et al.
MRS Bulletin|June 16, 2025
Revealing new depths of information with indentation mapping of microstructuresEdoardo Rossi, Christophe Tromas, Zhiying Liu, et al.
Ultramicroscopy|October 7, 2019
A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable pointLoïc Crouzier, Alexandra Delvallée, Sébastien Ducourtieux, et al.
Ultramicroscopy|July 12, 2024
Elastic strain mapping of plastically deformed materials by TEMArthur Després, Salomé Parent, Muriel Véron, et al.
Beilstein Journal of Nanotechnology|August 22, 2019
Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrologyLoïc Crouzier, Alexandra Delvallée, Sébastien Ducourtieux, et al.
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