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Christopher Habenschaden

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The Review of Scientific Instruments|December 23, 2025
On the influence of reference sample properties on magnetic force microscopy calibrationsBaha Sakar, Christopher Habenschaden, Sibylle Sievers, et al.
The Review of Scientific Instruments|November 12, 2024
Magnetic force microscopy: High quality-factor two-pass modeChristopher Habenschaden, Sibylle Sievers, Alexander Klasen, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
The Review of Scientific Instruments|December 23, 2025
On the influence of reference sample properties on magnetic force microscopy calibrationsBaha Sakar, Christopher Habenschaden, Sibylle Sievers, et al.
The Review of Scientific Instruments|November 12, 2024
Magnetic force microscopy: High quality-factor two-pass modeChristopher Habenschaden, Sibylle Sievers, Alexander Klasen, et al.
Pageof 1