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Christopher J Tourek

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The Review of Scientific Instruments|August 7, 2010
An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contactChristopher J Tourek, Sriram Sundararajan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 31, 2010
Atom scale characterization of the near apex region of an atomic force microscope tipChristopher J Tourek, Sriram Sundararajan
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Showing results (1-10 of 2) with videos related to

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Pageof 1
The Review of Scientific Instruments|August 7, 2010
An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contactChristopher J Tourek, Sriram Sundararajan
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 31, 2010
Atom scale characterization of the near apex region of an atomic force microscope tipChristopher J Tourek, Sriram Sundararajan
Pageof 1