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Christopher M Smyth

Showing results (1-10 of 6) with videos related to

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Materials (Basel, Switzerland)|January 11, 2025
Radiation Damage Mitigation in FeCrAl Alloy at Sub-Recrystallization TemperaturesMd Hafijur Rahman, Md Abu Jafar Rasel, Christopher M Smyth, et al.
ACS Applied Materials & Interfaces|August 17, 2019
Impact of Etch Processes on the Chemistry and Surface States of the Topological Insulator Bi<sub>2</sub>Se<sub>3</sub>Adam T Barton, Lee A Walsh, Christopher M Smyth, et al.
Nano Letters|July 18, 2019
Contact Engineering High-Performance n-Type MoTe<sub>2</sub> TransistorsMichal J Mleczko, Andrew C Yu, Christopher M Smyth, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 20, 2018
High-Mobility Helical Tellurium Field-Effect Transistors Enabled by Transfer-Free, Low-Temperature Direct GrowthGuanyu Zhou, Rafik Addou, Qingxiao Wang, et al.
ACS Applied Materials & Interfaces|January 3, 2024
Direct Characterization of Buried Interfaces in 2D/3D Heterostructures Enabled by GeO<sub>2</sub> Release LayerChristopher M Smyth, John M Cain, Alex Boehm, et al.
ACS Nano|January 24, 2018
Realizing Large-Scale, Electronic-Grade Two-Dimensional SemiconductorsYu-Chuan Lin, Bhakti Jariwala, Brian M Bersch, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Materials (Basel, Switzerland)|January 11, 2025
Radiation Damage Mitigation in FeCrAl Alloy at Sub-Recrystallization TemperaturesMd Hafijur Rahman, Md Abu Jafar Rasel, Christopher M Smyth, et al.
ACS Applied Materials & Interfaces|August 17, 2019
Impact of Etch Processes on the Chemistry and Surface States of the Topological Insulator Bi<sub>2</sub>Se<sub>3</sub>Adam T Barton, Lee A Walsh, Christopher M Smyth, et al.
Nano Letters|July 18, 2019
Contact Engineering High-Performance n-Type MoTe<sub>2</sub> TransistorsMichal J Mleczko, Andrew C Yu, Christopher M Smyth, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 20, 2018
High-Mobility Helical Tellurium Field-Effect Transistors Enabled by Transfer-Free, Low-Temperature Direct GrowthGuanyu Zhou, Rafik Addou, Qingxiao Wang, et al.
ACS Applied Materials & Interfaces|January 3, 2024
Direct Characterization of Buried Interfaces in 2D/3D Heterostructures Enabled by GeO<sub>2</sub> Release LayerChristopher M Smyth, John M Cain, Alex Boehm, et al.
ACS Nano|January 24, 2018
Realizing Large-Scale, Electronic-Grade Two-Dimensional SemiconductorsYu-Chuan Lin, Bhakti Jariwala, Brian M Bersch, et al.
Pageof 1