Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Christopher T Gibson

Showing results (11-20 of 68) with videos related to

Pageof 7
Sort By:
Ultramicroscopy|May 21, 2013
Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibrationAshley D Slattery, Adam J Blanch, Jamie S Quinton, et al.
Small (Weinheim an Der Bergstrasse, Germany)|March 26, 2018
Direct-Patterning SWCNTs Using Dip Pen Nanolithography for SWCNT/Silicon Solar CellsAlexander Corletto, LePing Yu, Cameron J Shearer, et al.
Journal of Hazardous Materials|November 26, 2021
Applying Raman imaging to capture and identify microplastics and nanoplastics in the gardenYunlong Luo, Christopher T Gibson, Clarence Chuah, et al.
Materials (Basel, Switzerland)|April 26, 2018
Efficiency Improvement Using Molybdenum Disulphide Interlayers in Single-Wall Carbon Nanotube/Silicon Solar CellsShaykha Alzahly, LePing Yu, Cameron J Shearer, et al.
Water Research|July 7, 2020
Identification and visualisation of microplastics/ nanoplastics by Raman imaging (ii): Smaller than the diffraction limit of laser?Cheng Fang, Zahra Sobhani, Xian Zhang, et al.
The Science of the Total Environment|August 28, 2022
Raman imaging for the identification of Teflon microplastics and nanoplastics released from non-stick cookwareYunlong Luo, Christopher T Gibson, Clarence Chuah, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|December 16, 2024
Probe-Based Mechanical Data Storage on Polymers Made by Inverse VulcanizationAbigail K Mann, Samuel J Tonkin, Pankaj Sharma, et al.
Nanotechnology|July 31, 2014
Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantileversAshley D Slattery, Adam J Blanch, Vladimir Ejov, et al.
Nanomaterials (Basel, Switzerland)|June 21, 2018
Measuring the Density of States of the Inner and Outer Wall of Double-Walled Carbon NanotubesBenjamin A Chambers, Cameron J Shearer, LePing Yu, et al.
Journal of Hazardous Materials|October 19, 2021
Raman imaging and MALDI-MS towards identification of microplastics generated when using stationery markersYunlong Luo, Zahra Sobhani, Zixing Zhang, et al.
Pageof 7

Showing results (11-20 of 68) with videos related to

Sort By:
Pageof 7
Ultramicroscopy|May 21, 2013
Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibrationAshley D Slattery, Adam J Blanch, Jamie S Quinton, et al.
Small (Weinheim an Der Bergstrasse, Germany)|March 26, 2018
Direct-Patterning SWCNTs Using Dip Pen Nanolithography for SWCNT/Silicon Solar CellsAlexander Corletto, LePing Yu, Cameron J Shearer, et al.
Journal of Hazardous Materials|November 26, 2021
Applying Raman imaging to capture and identify microplastics and nanoplastics in the gardenYunlong Luo, Christopher T Gibson, Clarence Chuah, et al.
Materials (Basel, Switzerland)|April 26, 2018
Efficiency Improvement Using Molybdenum Disulphide Interlayers in Single-Wall Carbon Nanotube/Silicon Solar CellsShaykha Alzahly, LePing Yu, Cameron J Shearer, et al.
Water Research|July 7, 2020
Identification and visualisation of microplastics/ nanoplastics by Raman imaging (ii): Smaller than the diffraction limit of laser?Cheng Fang, Zahra Sobhani, Xian Zhang, et al.
The Science of the Total Environment|August 28, 2022
Raman imaging for the identification of Teflon microplastics and nanoplastics released from non-stick cookwareYunlong Luo, Christopher T Gibson, Clarence Chuah, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|December 16, 2024
Probe-Based Mechanical Data Storage on Polymers Made by Inverse VulcanizationAbigail K Mann, Samuel J Tonkin, Pankaj Sharma, et al.
Nanotechnology|July 31, 2014
Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantileversAshley D Slattery, Adam J Blanch, Vladimir Ejov, et al.
Nanomaterials (Basel, Switzerland)|June 21, 2018
Measuring the Density of States of the Inner and Outer Wall of Double-Walled Carbon NanotubesBenjamin A Chambers, Cameron J Shearer, LePing Yu, et al.
Journal of Hazardous Materials|October 19, 2021
Raman imaging and MALDI-MS towards identification of microplastics generated when using stationery markersYunlong Luo, Zahra Sobhani, Zixing Zhang, et al.
Pageof 7