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Journal of Applied Statistics
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June 16, 2022
Monitoring of zero-inflated binomial processes with a DEWMA control chart
Vasileios Alevizakos, Christos Koukouvinos
Journal of Applied Statistics
|
December 19, 2022
Monitoring process mean and dispersion with one double generally weighted moving average control chart
Kashinath Chatterjee, Christos Koukouvinos, Angeliki Lappa
Journal of Applied Statistics
|
April 17, 2024
Distribution-free Phase II triple EWMA control chart for joint monitoring the process location and scale parameters
Vasileios Alevizakos, Kashinath Chatterjee, Christos Koukouvinos
Journal of Applied Statistics
|
January 15, 2025
A new EWMA chart for simultaneously monitoring the parameters of a shifted exponential distribution
Amita Baranwal, Nirpeksh Kumar, Kashinath Chatterjee, et al.
Journal of Applied Statistics
|
July 12, 2023
A double generally weighted moving average control chart for monitoring the process variability
Vasileios Alevizakos, Kashinath Chatterjee, Christos Koukouvinos, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Journal of Applied Statistics
|
June 16, 2022
Monitoring of zero-inflated binomial processes with a DEWMA control chart
Vasileios Alevizakos, Christos Koukouvinos
Journal of Applied Statistics
|
December 19, 2022
Monitoring process mean and dispersion with one double generally weighted moving average control chart
Kashinath Chatterjee, Christos Koukouvinos, Angeliki Lappa
Journal of Applied Statistics
|
April 17, 2024
Distribution-free Phase II triple EWMA control chart for joint monitoring the process location and scale parameters
Vasileios Alevizakos, Kashinath Chatterjee, Christos Koukouvinos
Journal of Applied Statistics
|
January 15, 2025
A new EWMA chart for simultaneously monitoring the parameters of a shifted exponential distribution
Amita Baranwal, Nirpeksh Kumar, Kashinath Chatterjee, et al.
Journal of Applied Statistics
|
July 12, 2023
A double generally weighted moving average control chart for monitoring the process variability
Vasileios Alevizakos, Kashinath Chatterjee, Christos Koukouvinos, et al.
Page
of 1