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Colin Ophus

Showing results (61-70 of 156) with videos related to

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The Journal of Physical Chemistry. B|January 11, 2019
Resolving the Morphology of Peptoid Vesicles at the 1 nm Length Scale Using Cryogenic Electron MicroscopyXi Jiang, Ryan K Spencer, Jing Sun, et al.
ACS Nano|November 11, 2024
Defect Self-Elimination in Nanocube Superlattices Through the Interplay of Brownian, van der Waals, and Ligand-Based Forces and TorquesJaewon Lee, Zexi Lu, Zhigang Wu, et al.
Nano Letters|September 29, 2018
Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope HolographyFehmi S Yasin, Tyler R Harvey, Jordan J Chess, et al.
Physical Review Letters|January 5, 2019
Segregation-Induced Nanofaceting Transition at an Asymmetric Tilt Grain Boundary in CopperNicolas J Peter, Timofey Frolov, Maria J Duarte, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Beyond Contrast Transfer: Spectral SNR as a Finite-Dose Metric for STEM Phase RetrievalGeorgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet, et al.
Nature Communications|March 16, 2022
Reversible writing/deleting of magnetic skyrmions through hydrogen adsorption/desorptionGong Chen, Colin Ophus, Alberto Quintana, et al.
Nature Materials|June 5, 2019
Diffraction imaging of nanocrystalline structures in organic semiconductor molecular thin filmsOuliana Panova, Colin Ophus, Christopher J Takacs, et al.
Nature Communications|June 6, 2019
Direct measurement of nanostructural change during in situ deformation of a bulk metallic glassThomas C Pekin, Jun Ding, Christoph Gammer, et al.
Nano Letters|June 10, 2021
Percolation of Ion-Irradiation-Induced Disorder in Complex Oxide InterfacesBethany E Matthews, Michel Sassi, Christopher Barr, et al.
Nano Letters|August 21, 2019
Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron MicroscopyYi Wen, Colin Ophus, Christopher S Allen, et al.
Pageof 16

Showing results (61-70 of 156) with videos related to

Sort By:
Pageof 16
The Journal of Physical Chemistry. B|January 11, 2019
Resolving the Morphology of Peptoid Vesicles at the 1 nm Length Scale Using Cryogenic Electron MicroscopyXi Jiang, Ryan K Spencer, Jing Sun, et al.
ACS Nano|November 11, 2024
Defect Self-Elimination in Nanocube Superlattices Through the Interplay of Brownian, van der Waals, and Ligand-Based Forces and TorquesJaewon Lee, Zexi Lu, Zhigang Wu, et al.
Nano Letters|September 29, 2018
Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope HolographyFehmi S Yasin, Tyler R Harvey, Jordan J Chess, et al.
Physical Review Letters|January 5, 2019
Segregation-Induced Nanofaceting Transition at an Asymmetric Tilt Grain Boundary in CopperNicolas J Peter, Timofey Frolov, Maria J Duarte, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 29, 2026
Beyond Contrast Transfer: Spectral SNR as a Finite-Dose Metric for STEM Phase RetrievalGeorgios Varnavides, Julie Marie Bekkevold, Stephanie M Ribet, et al.
Nature Communications|March 16, 2022
Reversible writing/deleting of magnetic skyrmions through hydrogen adsorption/desorptionGong Chen, Colin Ophus, Alberto Quintana, et al.
Nature Materials|June 5, 2019
Diffraction imaging of nanocrystalline structures in organic semiconductor molecular thin filmsOuliana Panova, Colin Ophus, Christopher J Takacs, et al.
Nature Communications|June 6, 2019
Direct measurement of nanostructural change during in situ deformation of a bulk metallic glassThomas C Pekin, Jun Ding, Christoph Gammer, et al.
Nano Letters|June 10, 2021
Percolation of Ion-Irradiation-Induced Disorder in Complex Oxide InterfacesBethany E Matthews, Michel Sassi, Christopher Barr, et al.
Nano Letters|August 21, 2019
Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron MicroscopyYi Wen, Colin Ophus, Christopher S Allen, et al.
Pageof 16