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Corey Stambaugh

Showing results (1-10 of 5) with videos related to

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Journal of Dynamic Systems, Measurement, and Control|April 16, 2019
Nanometer Positional Control using Magnetic Suspension for Vacuum-to-Air Mass MetrologyNicholas Vlajic, Melissa Davis, Corey Stambaugh
Applied Optics|August 5, 2014
Cavity-enhanced measurements for determining dielectric-membrane thickness and complex index of refractionCorey Stambaugh, Mathieu Durand, Utku Kemiktarak, et al.
Nanoscale|April 15, 2014
Dynamic and static measurement of interfacial capillary forces by a hybrid nanomechanical systemSoyoung Kwon, Corey Stambaugh, Bongsu Kim, et al.
Acta IMEKO (2012)|May 17, 2019
Progress on vacuum-to-air mass calibration system using magnetic suspension to disseminate the Planck-constant realized kilogramEric C Benck, Corey Stambaugh, Edward C Mulhern, et al.
Nanoscale|September 11, 2012
Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscopeSangmin An, Corey Stambaugh, Gunn Kim, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Journal of Dynamic Systems, Measurement, and Control|April 16, 2019
Nanometer Positional Control using Magnetic Suspension for Vacuum-to-Air Mass MetrologyNicholas Vlajic, Melissa Davis, Corey Stambaugh
Applied Optics|August 5, 2014
Cavity-enhanced measurements for determining dielectric-membrane thickness and complex index of refractionCorey Stambaugh, Mathieu Durand, Utku Kemiktarak, et al.
Nanoscale|April 15, 2014
Dynamic and static measurement of interfacial capillary forces by a hybrid nanomechanical systemSoyoung Kwon, Corey Stambaugh, Bongsu Kim, et al.
Acta IMEKO (2012)|May 17, 2019
Progress on vacuum-to-air mass calibration system using magnetic suspension to disseminate the Planck-constant realized kilogramEric C Benck, Corey Stambaugh, Edward C Mulhern, et al.
Nanoscale|September 11, 2012
Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscopeSangmin An, Corey Stambaugh, Gunn Kim, et al.
Pageof 1