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Craig M Shakarji

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Journal of Research of the National Institute of Standards and Technology|December 24, 2016
Least-Squares Fitting Algorithms of the NIST Algorithm Testing SystemCraig M Shakarji
Journal of Computing and Information Science in Engineering|October 9, 2024
Toward a New Mathematical Definition of Datums in Standards to Support Advanced ManufacturingCraig M Shakarji, Vijay Srinivasan
Optics Express|July 1, 2010
RECIST versus volume measurement in medical CT using ellipsoids of known sizeZachary H Levine, Bruce R Borchardt, Nolan J Brandenburg, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|December 24, 2016
Least-Squares Fitting Algorithms of the NIST Algorithm Testing SystemCraig M Shakarji
Journal of Computing and Information Science in Engineering|October 9, 2024
Toward a New Mathematical Definition of Datums in Standards to Support Advanced ManufacturingCraig M Shakarji, Vijay Srinivasan
Optics Express|July 1, 2010
RECIST versus volume measurement in medical CT using ellipsoids of known sizeZachary H Levine, Bruce R Borchardt, Nolan J Brandenburg, et al.
Pageof 1