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Proceedings of the National Academy of Sciences of the United States of America|June 16, 2010
Microscopic origins for stabilizing room-temperature ferromagnetism in ultrathin manganite layersL Fitting Kourkoutis, J H Song, H Y Hwang, et al.Physical Review Letters|February 7, 2007
Nanometer scale electronic reconstruction at the interface between LaVO3 and LaVO4L Fitting Kourkoutis, Y Hotta, T Susaki, et al.Nature|April 27, 2002
Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk SiP M Voyles, D A Muller, J L Grazul, et al.Ultramicroscopy|January 24, 2009
A high-speed area detector for novel imaging techniques in a scanning transmission electron microscopeT A Caswell, P Ercius, M W Tate, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 31, 2004
Thin dielectric film thickness determination by advanced transmission electron microscopyA C Diebold, B Foran, C Kisielowski, et al.Nature|October 10, 2008
High-temperature interface superconductivity between metallic and insulating copper oxidesA Gozar, G Logvenov, L Fitting Kourkoutis, et al.Physical Review Letters|February 1, 2008
Valence changes and structural distortions in "charge ordered" manganites quantified by atomic-scale scanning transmission electron microscopyJ C Loudon, L Fitting Kourkoutis, J S Ahn, et al.Journal of Microscopy|September 29, 2011
Analytical electron microscopy of black carbon and microaggregated mineral matter in Amazonian dark EarthC H Chia, P Munroe, S D Joseph, et al.Science (New York, N.Y.)|February 23, 2008
Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopyD A Muller, L Fitting Kourkoutis, M Murfitt, et al.Physical Review Letters|October 4, 2003
Evidence for a new class of defects in highly n-doped Si: donor-pair-vacancy-interstitial complexesP M Voyles, D J Chadi, P H Citrin, et al.Pageof 4