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Acta Crystallographica. Section A, Foundations and Advances|July 2, 2020
Extending the Debye scattering equation for diffraction from a cylindrically averaged group of atoms: detecting molecular orientation at an interfaceA E Ross, D G McCulloch, D R McKenzieThe Journal of Chemical Physics|June 15, 2007
Modeling of structure and porosity in amorphous silicon systems using Monte Carlo methodsG Opletal, T C Petersen, I K Snook, et al.Ultramicroscopy|May 12, 2005
Refinements in the collection of energy filtered diffraction patterns from disordered materialsT C Petersen, W McBride, D G McCulloch, et al.Micron (Oxford, England : 1993)|August 3, 2011
The near edge structure of cubic boron nitrideD G McCulloch, D W M Lau, R J Nicholls, et al.Nuclear Medicine Communications|June 1, 1996
A study of Technegas employing X-ray photoelectron spectroscopy, scanning transmission electron microscopy and wet-chemical methodsP Jackson, R J Baker, D G McCulloch, et al.Journal of Physics. Condensed Matter : an Institute of Physics Journal|August 6, 2011
Enhancing the hardness of Al/W nanostructured coatingsF A Burgmann, D G McCulloch, L Ryves, et al.Nanoscale|October 27, 2018
Sensory gating in bilayer amorphous carbon memristorsT J Raeber, A J Barlow, Z C Zhao, et al.Nanotechnology|August 6, 2011
Nanostructured SnO(2) films prepared from evaporated Sn and their application as gas sensorsJ G Partridge, M R Field, J L Peng, et al.Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 1, 2011
The origin of preferred orientation during carbon film growthM B Taylor, D W M Lau, J G Partridge, et al.Physical Review Letters|June 4, 2008
Abrupt stress induced transformation in amorphous carbon films with a highly conductive transition phaseD W M Lau, D G McCulloch, M B Taylor, et al.Pageof 2