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IEEE Transactions on Applied Superconductivity : a Publication of the IEEE Superconductivity Committee|January 18, 2021
Use of Transition Models to Design High Performance TESs for the LCLS-II Soft X-Ray SpectrometerKelsey M Morgan, Dan T Becker, Douglas Alan Bennett, et al.The Review of Scientific Instruments|January 3, 2020
A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trapP Szypryt, G C O'Neil, E Takacs, et al.Physical Review Letters|March 25, 2025
First Measurement of Z Opacity Sample Evolution near Solar Interior Conditions Using Time-Resolved SpectroscopyG P Loisel, J E Bailey, T Nagayama, et al.The Review of Scientific Instruments|November 8, 2018
Design and raytrace simulations of a multilayer-coated Wolter x-ray optic for the Z machine at Sandia National LaboratoriesJ K Vogel, M J Pivovaroff, B Kozioziemski, et al.Journal of Low Temperature Physics|June 22, 2016
Developments in Time-Division Multiplexing of X-ray Transition-Edge SensorsW B Doriese, K M Morgan, D A Bennett, et al.The Review of Scientific Instruments|November 8, 2018
A Wolter imager on the Z machine to diagnose warm x-ray sourcesJ R Fein, D J Ampleford, J K Vogel, et al.The Review of Scientific Instruments|June 3, 2017
A practical superconducting-microcalorimeter X-ray spectrometer for beamline and laboratory scienceW B Doriese, P Abbamonte, B K Alpert, et al.IEEE Transactions on Applied Superconductivity : a Publication of the IEEE Superconductivity Committee|July 31, 2019
Optimization of Time- and Code-Division-Multiplexed Readout for Athena X-IFUW B Doriese, S R Bandler, S Chaudhuri, et al.The Journal of Chemical Physics|December 10, 2017
L-edge spectroscopy of dilute, radiation-sensitive systems using a transition-edge-sensor arrayCharles J Titus, Michael L Baker, Sang Jun Lee, et al.IEEE Transactions on Applied Superconductivity : a Publication of the IEEE Superconductivity Committee|May 9, 2022
Design of a 3000-Pixel Transition-Edge Sensor X-Ray Spectrometer for Microcircuit TomographyPaul Szypryt, Douglas A Bennett, William J Boone, et al.Pageof 3