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Ultramicroscopy|December 13, 2016
Composition quantification of electron-transparent samples by backscattered electron imaging in scanning electron microscopyE Müller, D GerthsenJournal of Microscopy|January 11, 2007
An improved method for angular-resolved characterization of the optical anisotropy of pyrolytic carbonB Reznik, D Gerthsen, E BortchagovskyUltramicroscopy|March 8, 2003
Determination of the mean inner potential in III-V semiconductors by electron holographyP Kruse, A Rosenauer, D GerthsenJournal of Microscopy|April 20, 2019
Electron beam broadening in electron-transparent samples at low electron energiesM Hugenschmidt, E Müller, D GerthsenUltramicroscopy|December 2, 2017
Electron-beam broadening in amorphous carbon films in low-energy scanning transmission electron microscopyH Drees, E Müller, M Dries, et al.Ultramicroscopy|May 6, 2008
Effect of a physical phase plate on contrast transfer in an aberration-corrected transmission electron microscopeB Gamm, K Schultheiss, D Gerthsen, et al.Ultramicroscopy|September 24, 2019
Differential electron scattering cross-sections at low electron energies: The influence of screening parameterM Čalkovský, E Müller, M Hugenschmidt, et al.Ultramicroscopy|August 30, 2005
Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holographyP Kruse, M Schowalter, D Lamoen, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 21, 2006
EELS investigations of different niobium oxide phasesD Bach, H Störmer, R Schneider, et al.Journal of Microscopy|April 19, 2022
Carbon-film-based Zernike phase plates with smooth thickness gradient for phase-contrast transmission electron microscopy with reduced fringing artefactsM Obermair, S Hettler, M Dries, et al.Pageof 3