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Ultramicroscopy|December 1, 1975
Aperture contrast in thick amorphous specimens using scanning transmission electron microscopyD J Smith, J M Cowley
Ultramicroscopy|April 4, 2003
Ultra-high resolution with off-axis STEM holographyJ M Cowley
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Off-axis STEM or TEM holography combined with four-dimensional diffraction imagingJ M Cowley
Ultramicroscopy|April 20, 2001
Comments on ultra-high-resolution STEMJ M Cowley
Microscopy Research and Technique|July 29, 1999
Electron nanodiffractionJ M Cowley
Journal of Electron Microscopy|July 27, 2001
STEM imaging with a thin annular detectorJ M Cowley
Ultramicroscopy|April 11, 2002
Electron nanodiffraction methods for measuring medium-range orderJ M Cowley
Ultramicroscopy|June 1, 1976
The extension of scanning transmission electron microscopy by use of diffraction informationJ M Cowley
Ultramicroscopy|December 1, 1976
Scanning transmission electron microscopy of thin specimensJ M Cowley
Micron (Oxford, England : 1993)|March 10, 2004
Applications of electron nanodifractionJ M Cowley
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